Specifications

• Configured for 80 or 200 (default) kV operation
• X-FEG field emission gun
• Single-tilt and low-background double-tilt (hex ring) holders available:
• Alpha tilt:+-30 degree, Beta tilt; 30 degree
• Bottom-mounted Thermo Ceta 16 megapixel CMOS camera
• Line Resolution: /information limit: 0.12nm
• Point Resolution: 0.25nm
• TEM Line Resolution: 0.10nm
• Ceta speed enhancement for recording sample operation videos
• STEM Resolution: 0.16 nm
• STEM detector: BF, DF, HDAAF, Segmented Panther Detector
• EDX detector energy resolution 122eV @ 10kcps/Elemental Mapping
• Selected Area Electron Diffraction (SAED)
• Software: Velox

Application:

• High-resolution imaging of crystal structures, grain boundaries, and nanoparticles to study materials at the atomic scale.
• Visualization of cellular structures (e.g., organelles, viruses, proteins) at nanometer resolution for disease and function analysis.
• Investigation of fractures, defects, and dislocations in metals, semiconductors, and composites to understand failure mechanisms.
• Determination of crystal orientation, phase identification, and diffraction patterns using selected area electron diffraction (SAED).

Content will be updated soon.

Content will be updated soon..

Name: Dr Jayita Sarkar

Designation: Snr Scientific Officer

Phone:0291 280 1343

Email:jsarkar[at]iitj[dot]ac[dot]in

Name: Dr Saloni Sharma

Designation: Scientific Officer

Phone:0291 280 1347

Email:saloni[at]iitj[dot]ac[dot]in

Name: Mr lalit Mohan

Designation: Junior Assistant

Phone:0291 280 1344

Email: